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TFX3000P
Tfx3000p is a kind of thin film thickness measurement equipment used in 12 inch LSI front-end production line. The product has been successfully sold ...
TFX3000-Optical measuring equipment
TFX3000 is optical thin film measurement equipment for integrated circuit production line 300mm silicon chip with independent intellectual property ri...
TFX3200
TFX3200 is a thin film thickness measuring device for 8 inch LSI front end production line. The product has the same measuring performance and stabili...
FSD150e & FSD150i
FSD150e & FSD150i is a fully automatic optical inspection equipment (AOI) developed and produced by Ruili Scientific Instruments (Shanghai) Co., Ltd. ...
FSD150s
FSD150s is a fully automatic optical inspection equipment (AOI) developed and produced by Ruili Scientific Instruments (Shanghai) Co., Ltd. specifical...
FSD100c & 150c
FSD100c & 150c is an AOI device developed by Ruili Scientific Instruments (Shanghai) Co., Ltd. specifically for the detection of the appearance defect...
FSD300--Auto macro defects detection system
Originally developed in Japan by WINS Co. Ltd., now enhanced by RMEC with higher sensitivity, higher throughput, wider applications and richer feature...
FSD200µ--Auto macro defects detection system
Originally developed in Japan by WINS Co. Ltd., now enhanced by RMEC with higher sensitivity, higher throughput, wider applications and richer feature...
FSD100e--Auto optical inspection equipment
FSD100e is RMEC’s Automatic Optical Inspection tool (AOI) designed specifically for LED market. It can inspect sapphire substrate, PSS, epi and chip w...
Gallium Liquid Metal Ion Source
Gallium Liquid Metal Ion Sources (LMIS) designed and manufactured by RSIC are used in FIB (Focused Ion Beam) equipments widely used in science and ind...